The semiconductor test equipment reproduces real-user environments on AP/CPU-based boards and validates the reliability of LPDDR and UFS memory via socket mounting.
About Memory Test Solutions
A single/multi parallel Field Level tester that validates memory component or module at the
OS level in AP/CPU-based, real-user environments for mobile, PC, and server platforms.
A system level tester that implements an OS based user environment on a test board with an AP or CPU and validates the integrity of LPDDR or UFS memory by putting into a socket.
Supports the latest memory standards, various ball types and form factors, and by supporting VDD and VCC power adjustment, debug interfaces and both DC and battery power, it enables verification of memory operation in an operating environment identical to real use.
By adding a shielded housing to 1 Para Open Type Field Level Tester, it provides a stable test environment that is robust to changes in external conditions.
On the front panel, the values and status information of VDD2H·VDD2L·VDDQ/VCC VCCQ are displayed in real time on a display.
A Multi Para field level tester that allows multiple AP Kits to be mounted on a single board and tested simultaneously.
A Multi Para field level tester that allows multiple AP Kits to be mounted on a single board and tested simultaneously.
Custom layouts (e.g. 1X2, 2X4) other than the above configurations are available upon request and separate agreement.
