Introduce the optimized solution that maximizes the efficiency of semiconductor testing.
A single/multi parallel Field Level tester that validates memory component or module at the
OS level in AP/CPU-based, real-user environments for mobile, PC, and server platforms.
Applies efficient, fast-response nonlinear robust control to thermoelectric module, combined with a high efficiency water cooled heat dissipation jacket using an MFC* for hot/cold test condition.
* MFC: Micro-Flow Cooling
An integrated, automated test equipment with our patented temperature control solution and, through unified design and control of tester and handler delivers high efficiency and operational stability.
The world’s first System Level tester capable of HBM all-pin testing, supporting full-I/O functional testing under real-speed HBM operating conditions.
Coming Soon
Supports final testing in the back-end process. DC/functional/real-speed test for memory component and module and enhances versatility to cover multiple types by changing the DSA*.
* DSA: Device Specific Adaptor
Coming Soon
