Integrating the handler and Field Level Tester, this Full Auto solution manages the entire test process through a single UI and provides memory specific Teaching Data, handler operating conditions, temperature profiles, and DB based management of all test data.
Benefits of Handler Integrated Auto Tester
A Semi-Auto test system capable of testing up to 128 memories, it uses a Chamber and DUT configuration in 8/16 Para units to utilize space more efficiently. Through Ethernet based integrated test environment, each AP Kit individually provides temperature control, pattern, monitoring and log collection and it supports new memory standards simply by replacing the AP Kit.
An integrated, automated test equipment with our patented temperature control solution and, through unified design and control of tester and handler delivers high efficiency and operational stability.
With 6 sets of 16 Para Field Level testers, chamber & DUT, it is a high parallel memory
Semi-Auto Tester that can test up to 96 memories simultaneously.
With 4 sets of 8 Para Field Level testers, chamber & DUT, it is a high parallel memory Semi-Auto Tester that can test up to 32 memories simultaneously.
With 2 sets of 16 Para Field Level testers, chamber & DUT, it is a high parallel memory Semi-Auto Tester that can test up to 32 memories simultaneously.
Full Auto Tester expandable when docked with Handler
