Integrating the handler and Field Level Tester, this Full Auto solution manages the entire test process through a single UI and provides memory specific Teaching Data, handler operating conditions, temperature profiles, and DB based management of all test data.
Benefits of Handler Integrated Auto Tester
A Semi-Auto test system capable of testing up to 128 memories, it uses a Chamber and DUT configuration in 8/16 Para units to utilize space more efficiently. Through Ethernet based integrated test environment, each AP Kit individually provides temperature control, pattern, monitoring and log collection and it supports new memory standards simply by replacing the AP Kit.
An integrated, automated test equipment with our patented temperature control solution and, through unified design and control of tester and handler delivers high efficiency and operational stability.
A compact type Handler Integrated Auto Tester that is configured with 2 sets of 16 Para mobile AP based tester, Chamber and DUT.
A compact type Handler Integrated Auto Tester that is configured with 2 sets of 32 Para Intel CPU based tester, Chamber and DUT.
A high parallel handler integrated field Level tester that is configured with 8 sets of 16 Para tester, Chamber and DUT. It supports simultaneous testing up to 128 memories.
A high parallel handler integrated field Level tester for graphic memory. It is configured with 16 sets of 12 Para tester, Chamber and DUT.
(Graphic Memory Test Handler for NVIDIA A5500)
